Please use this identifier to cite or link to this item:
https://hdl.handle.net/2440/115335
Citations | ||
Scopus | Web of Science® | Altmetric |
---|---|---|
?
|
?
|
Type: | Journal article |
Title: | Carbon nanotube modified probes for stable and high sensitivity conductive atomic force microscopy |
Author: | Slattery, A. Shearer, C. Gibson, C. Shapter, J. Lewis, D. Stapleton, A. |
Citation: | Nanotechnology, 2016; 27(47):475708-1-475708-8 |
Publisher: | IOP Publishing |
Issue Date: | 2016 |
ISSN: | 0957-4484 1361-6528 |
Statement of Responsibility: | Ashley D Slattery, Cameron J Shearer, Christopher T Gibson, Joseph G Shapter, David A Lewis and Andrew J Stapleton |
Abstract: | Conductive atomic force microscopy (C-AFM) is used to characterise the nanoscale electrical properties of many conducting and semiconducting materials. We investigate the effect of single walled carbon nanotube (SWCNT) modification of commercial Pt/Ir cantilevers on the sensitivity and image stability during C-AFM imaging. Pt/Ir cantilevers were modified with small bundles of SWCNTs via a manual attachment procedure and secured with a conductive platinum pad. AFM images of topography and current were collected from heterogeneous polymer and nanomaterial samples using both standard and SWCNT modified cantilevers. Typically, achieving a good current image comes at the cost of reduced feedback stability. In part, this is due to electrostatic interaction and increased tip wear upon applying a bias between the tip and the sample. The SWCNT modified tips displayed superior current sensitivity and feedback stability which, combined with superior wear resistance of SWCNTs, is a significant advancement for C-AFM. |
Rights: | © 2016 IOP Publishing Ltd |
DOI: | 10.1088/0957-4484/27/47/475708 |
Published version: | http://dx.doi.org/10.1088/0957-4484/27/47/475708 |
Appears in Collections: | Aurora harvest 8 Chemical Engineering publications |
Files in This Item:
There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.