Please use this identifier to cite or link to this item: https://hdl.handle.net/2440/28445
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Type: Conference paper
Title: Coverage measurement for software application level verification using symbolic trajectory evaluation techniques
Author: Cheng, A.
Parashkevov, A.
Lim, C.
Citation: DELTA 2004 : second IEEE International Workshop on Electronic Design, Test and Applications : proceedings:pp.237-242
Part of: Proceedings on the 2nd IEE International Workshop on Electronic Design, Test and Applications 2004
Publisher: IEEE
Publisher Place: Los Alamitos, California
Issue Date: 2004
Series/Report no.: International Symposium on Electronic Design Test and Applications DELTA
ISBN: 0769520812
9780769520810
Conference Name: IEEE International Workshop on Electronic Design, Test and Applications (2nd : 2004 : Perth, Australia)
Editor: Osseiran, A.
Statement of
Responsibility: 
Adriel Cheng, Atanas Parashkevov, Cheng-Chew Lim
Abstract: Design verification of a systems-on-a-chip is a bottleneck for hardware design projects. A new solution is a design verification methodology that applies coverage driven verification at the embedded software application level. This methodology currently lacks an appropriate coverage measurement technique. This paper proposes a new coverage model for the software application level. Using this coverage model, a novel technique to represent and measure coverage is described. This technique uses ideas such as control graph structures and checking algorithms to estimate the completeness of software application verification.
Description: Copyright © 2004 IEEE
DOI: 10.1109/DELTA.2004.10047
Published version: http://dx.doi.org/10.1109/delta.2004.10047
Appears in Collections:Aurora harvest 6
Electrical and Electronic Engineering publications

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