Please use this identifier to cite or link to this item: https://hdl.handle.net/2440/34137
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dc.contributor.authorAlagumalai, Sivakumaren
dc.contributor.authorKeeves, John Philipen
dc.contributor.authorNjora, H.en
dc.date.issued2002en
dc.identifier.urihttp://hdl.handle.net/2440/34137-
dc.language.isoenen
dc.titleMeaningful assessment: A case for intelligent adaptive testing systemsen
dc.typeConference paperen
dc.contributor.schoolSchool of Educationen
dc.contributor.conferenceInternational Test Users' Conference (2002 : Sydney, New South Wales)en
Appears in Collections:Education publications

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