Please use this identifier to cite or link to this item: https://hdl.handle.net/2440/35246
Type: Conference paper
Title: Analysis and optimization of attribute combinations coverage for SoC testing
Author: Cheng, A.
Lim, C.
Parashkevov, A.
Citation: Proceedings of the 2006 International SoC Design Conference, 2006 / Hang Guen Jeong, (ed./s), pp.CDROM482-CDROM485
Publisher: IEEK
Publisher Place: CDROM
Issue Date: 2006
Conference Name: International SoC Design Conference (26 Oct 2006 : Seoul, Korea)
Editor: Hang Guen Jeong,
Appears in Collections:Aurora harvest
Electrical and Electronic Engineering publications

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