Please use this identifier to cite or link to this item: https://hdl.handle.net/2440/88046
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Type: Journal article
Title: Ultra-low vibration pulse-tube cryocooler stabilized cryogenic sapphire oscillator with 10⁻¹⁶ fractional frequency stability
Other Titles: Ultra-low vibration pulse-tube cryocooler stabilized cryogenic sapphire oscillator with 10(-16) fractional frequency stability
Author: Hartnett, J.
Nand, N.
Citation: IEEE Transactions on Microwave Theory and Techniques, 2010; 58(12):3580-3586
Publisher: IEEE
Issue Date: 2010
ISSN: 0018-9480
1557-9670
Statement of
Responsibility: 
John G. Hartnett and Nitin R. Nand
Abstract: A low maintenance long-term operational cryogenic sapphire oscillator has been implemented at 11.2 GHz using an ultra-low-vibration cryostat and pulse-tube cryocooler. It is currently the world's most stable microwave oscillator employing a cryocooler. Its performance is explained in terms of temperature and frequency stability. The phase noise and the Allan deviation of frequency fluctuations have been evaluated by comparing it to an ultra-stable liquid-helium cooled cryogenic sapphire oscillator in the same laboratory. Assuming both contribute equally, the Allan deviation evaluated for the cryocooled oscillator is σy ≈ 1 × 10-15τ-1/2 for integration times 1 <; τ <; 10 s with a minimum σy = 3.9 × 10-16 at τ = 20 s. The long term frequency drift is less than 5×10-14/day. From the measured power spectral density of phase fluctuations, the single-sideband phase noise can be represented by Lφ(f) = 10-14.0/f4+10-11.6/f3+10-10.0/f2+10-10.2/f+ 10-11.0 rad2/Hz for Fourier frequencies 10-3 <; f <; 103 Hz in the single oscillator. As a result, Lφ ≈ -97.5 dBc/Hz at 1-Hz offset from the carrier.
Keywords: Cryocooler
cryogenic sapphire oscillator
frequency stability
phase noise
Rights: © 2010 IEEE
DOI: 10.1109/TMTT.2010.2086551
Published version: http://dx.doi.org/10.1109/tmtt.2010.2086551
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